Surge testing is a method of testing the transient voltage or current of a circuit or device.
In chips designing and manufacturing, various electromagnetic interferences such as surges and other unexpected events are often encountered. These events may damage the circuit structure inside the chip, causing the chip to fail or work unstable.
The causes of power chip surge?
1. Switching power supply and sudden voltage changes
When the power switches, due to the discharge of the instantaneous capacitor, a brief voltage rise will occur in the circuit, resulting in a brief increase in current, which will cause surge current phenomenon. In the power system, sudden voltage changes caused by strong lightning can also lead to the generation of surges.
2. Transient process of power equipment
When electrical equipment starts, stops, or runs, there will be a brief voltage rise, and the switching of mechanical switches can also cause the generation of surge currents.
3. Short circuit faults
When there's a short circuit fault in the circuit, whether it is in a low-voltage distribution network or a high-voltage transmission line, it will cause an instantaneous rise of the current, which is mostly surge current.
Surge currents can cause significant damage to circuits and electronic devices, including device damage, short circuits, etc. When a large amount of surge current flows through a circuit, it will cause temporary charge accumulation and discharge, and generate high voltage peaks, which cause great damage to the electronic devices.
Surge testing can detect whether the chip can withstand surge interference, such as current, voltage, time and other parameters, to determine whether the tested product can work normally.
When conducting surge testing, we need to use professional measuring instruments such as surge generators, differential probes, current loops, and other instrument devices. Operators need to strictly follow the usage specifications and testing procedures of the testing instruments to ensure the accuracy and reliability of the test data.
Surge testing and testing methods
1. Prepare surge generators, differential probes, current loops, oscilloscopes, power supplies, and other instrument devices. Provide voltage and current to the chip through the power supply, and the oscilloscope tests surge current at output of the chip.
2. Specify the testing plan and execute it. Before testing, a detailed testing plan should be developed, including relevant parameters such as test voltage, test time, and test frequency. After the test plan is completed, testing can begin.
3. Data analysis and processing. After the testing is completed, data analysis and processing of the test results are required to determine the chip's ability to withstand surges and how to improve its stability and reliability.
For electronic products manufacturing enterprises, it is necessary to strictly follow the testing process and relevant standards to ensure the accuracy and reliability of the test results.
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